M&M 2018 X40 Experimental and Simulation Methods in 4D-STEM: Scanning Electron Nanobeam Diffraction from nanobeam Watch Video
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⏲ Duration: 40 min 48 sec ✓ Published: 09-Nov-2018
Description: Presenter: Colin Ophus, Lawrence Berkeley National LaboratorynnTraditional scanning transmission electron microscopy (STEM) detectors are large, single pixels that integrate a subset of the transmitted electron beam signal scattered from each electron probe position. These transmitted signals are extremely rich in information, containing localized information on sample structure, composition, phonon spectra, three-dimensional defect crystallography and more. Conventional STEM imaging experiments
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